Research Article

The Design and Process Reliability Analysis of Millimeter Wave CMOS Power Amplifier with a Cold Mode MOSFET Linearization

Table 2

Comparison of key parameters with existing power amplifier designs.

Ref.Process node (nm)Freq (GHz)Gain (dB)OIP1-dB (dBm)PAE (%)Psat (dBm)Results

Khan and Wahab [1]1302463012.5Simulated
Portela et al. [4]1802416.213.622.517.5Simulated
Jen et al. [5]1802714.513.214Measured
Chang et al. [8]1302412.220.517.5Simulated
Kuo et al. [9]1802211.914.310.716.8Measured
Tsai et al. [14]90609.810.211.410.7Measured
Koo et al. [24]1302415.613.317.716Measured
Shang et al. [34]452418.639.722.4Measured
Ciocoveanu et al. [35]150 GaAs33–371826.7Simulated
This work652821.118.61722.4Extracted